半导体测试系统P1 

       P1测试机是具有成本效益,基于PXI架构的测试解决方案。通过PXI机箱和各种板卡的组合,P1可以很容易地提供先进的数字、模拟或RF测试能力。基于PXI的开放体系结构,P1提供了灵活和可扩展的解决方案,可以被配置成PA,LNA,Switch,Filter等射频测试应用的测试需求范围。是半导体ATE芯片测试的理想解决方案。

特点
      基于PowerValue PXI仪器和FlexSYS RF软件                   理想的射频/数字IC测试
      灵活的系统配置                                                             支持多达256 Site测试,适合大批量生产测试
      

P1测试机接口
      
      

• GPIB / Serial / TTL ports      
• 16 RF Ports

• USB / Video / ENET
• AC Power Supply
• ESD Wrist Strap connection
• On/Off Control
• Status LEDS
• EMO

Flexsys RF

Software

Tester Resource

Power Amplifier

Switch Controller Port Module

SMU

PC/VSG/VSA/PXIE Control Card

Power Supply

Architecture of P1

1.General

1.1 Instrument Slots in Chassis: 18/9/6 Slots
1.2 Digital Pin Count: up to 256
1.3 Thermal Management: Air cooled
1.4 Prober and Handler Interfaces: standard interfaces
1.5 Total System Weight:450kg

2.RF System

2.1 VNA Frequency: 6 range option,from 300kHz-26.5GHz
2.2 VSA RF Input: 250 MHz to 6 GHz
2.3 VSA Baseband Input: 10 kHz to 1 GHz
2.4 RF Input Level Range: -120 dBm to +30 dBm
2.5 Baseband Input Level: +4dbm
2.6 VSG Output: 250 MHz to 6 GHz
2.7 Analog Bandwidth: DC to 165 MHz
2.8 RF Output Level Range: -120 dBm to +20 dBm
2.9 Signal Conditioner Power amplifcation to +27dBm
Attenuation to -110 dBm

3. Power Supply System

3.1 DPS8:  8 channels per DPS8 board
3.2 Current:  Up to 1A per channels and merged to 8A per board
3.3 Channels:Maximum 32 channels forSingle chassis system

4. DC Instrumentation

4.1 IO32 : 32 channels per IO32 boad
4.2 Channels:Maximum 256 channels for single chassis system
4.3 Digital pattern speed: Maximum 200Mbps
4.4 Memory: Maximum 64M vector memory per pin

5. Software

5.1 FlexSYS RF Software

参数概览